Standard AFM Probe
1.0_standard_specs-cantStandard AFM Probe Tip Specs – SideStandard AFM Probe Tip SpecsStandard AFM Probe TipStandard AFM Probe TipStandard AFM Probe Cantilever SpecsStandard AFM Probe Cantilever

Conductive Contact Probes

Standard AFM Probes for Conductive Contact Mode

Our standard silicon AFM probes are available with conductive coatings – Au, TiN, PtIr. The conductive AFM probe has reflective side coating to increase laser signal. Extremely sharp tips allow the user to obtain high-quality images of samples. Standard chip sizes make our probes compatible with most AFM manufacturers. Contact mode is the easiest scanning technique for atomic force microscopy, yet it can allow you to achieve atomic and molecular resolution. The AFM probe is in constant contact with the sample which provides the highest quality scans. Contact mode AFM probes are best for scanning hard surfaces.

$414.00$1,200.00

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Specifications

Cantilever
Length
Width
Thickness
Resonant Frequency kHz
Force Constant Nm
± 10μm
± 5μm
± 0.5μm
Min
Typical
Max
Min
Typical
Max
CSG01350 30 1 4 9.8 17 0.003 0.03 0.13
CSG10225 30 1 8 22 39 0.01 0.11 0.5
CSG30190 30 1.5 26 48 76 0.13 0.6 2

Cantilever Specifications
Material Single Crystal Silicon, N-type, 0.01-0.025 Ω-cm, Antimony doped
Cantilever Geometry Rectangular (cross-section is trapezium)
Number of Cantilevers 1
Back Side Coating Au reflective coating (reflectivity is 3x better in comparison with uncoated probes)
Tip Side Coating Au, TiN, or PtIr
Coating Thickness Au: 35nm
TiN, PtIr: 25nm
Tip Specifications
Tip Geometry Tetrahedral, the last 500 nm from tip apex is cylindrical
Tip Height 14 – 16 μm
Tip Aspect Ratio 3:1 – 7:1
Tip Offset (Setback) 5 – 20 μm
Tip Front Angle 10 ± 2°
Tip Back Angle 30 ± 2°
Tip Side Angle (half) 18 ± 2°
Tip Cone Angle 7 – 10°
Tip Curvature Radius (Nom) 20 nm
Tip Curvature Radius (Max) 35 nm (guaranteed)
General Information
  • Standard chip size: 1.6×3.4×0.3 mm
  • The base silicon is highly doped to avoid electrostatic charges.

Additional Information

Product Yield
Guaranteed product yield is better than 90%
Packaging
Probes are packaged in GelPak® boxes (GelPak® is a registered trade mark of Vichem Corporation)
Warranty
  • 1 year for uncoated probes
  • 6 months for probes with conductive coating
Shipping
All in-stock items ship within 24 hours.
Standard Ground, 2-Day, Next Day options available.
Details Price QTY
CSG01/Au/15
Cantilever Series: CSG01
Product Probe Options: Au conductive coating
Product Tip Quantity: 15
$414.00
CSG30/Pt/50
Cantilever Series: CSG30
Product Probe Options: PtIr conductive coating
Product Tip Quantity: 50
$1,093.00
CSG10/Pt/50
Cantilever Series: CSG10
Product Probe Options: PtIr conductive coating
Product Tip Quantity: 50
$1,093.00
CSG10/Au/15
Cantilever Series: CSG10
Product Probe Options: Au conductive coating
Product Tip Quantity: 15
$414.00
CSG01/Pt/15
Cantilever Series: CSG01
Product Probe Options: PtIr conductive coating
Product Tip Quantity: 15
$414.00
CSG01/TiN/15
Cantilever Series: CSG01
Product Probe Options: TiN conductive coating
Product Tip Quantity: 15
$460.00
CSG30/Pt/15
Cantilever Series: CSG30
Product Probe Options: PtIr conductive coating
Product Tip Quantity: 15
$414.00
CSG01/Au/50
Cantilever Series: CSG01
Product Probe Options: Au conductive coating
Product Tip Quantity: 50
$1,093.00
CSG10/Pt/15
Cantilever Series: CSG10
Product Probe Options: PtIr conductive coating
Product Tip Quantity: 15
$414.00
CSG10/TiN/50
Cantilever Series: CSG10
Product Probe Options: TiN conductive coating
Product Tip Quantity: 50
$1,200.00
CSG01/TiN/50
Cantilever Series: CSG01
Product Probe Options: TiN conductive coating
Product Tip Quantity: 50
$1,200.00
CSG01/Pt/50
Cantilever Series: CSG01
Product Probe Options: PtIr conductive coating
Product Tip Quantity: 50
$1,093.00
CSG10/Au/50
Cantilever Series: CSG10
Product Probe Options: Au conductive coating
Product Tip Quantity: 50
$1,093.00