Standard AFM Probe
1.0_standard_specs-cantStandard AFM Probe Tip Specs – SideStandard AFM Probe Tip SpecsStandard AFM Probe TipStandard AFM Probe TipStandard AFM Probe Cantilever SpecsStandard AFM Probe Cantilever

Bare Noncontact/Tapping AFM Probes

Standard AFM Bare Probes for Noncontact/Tapping Modes

Our standard silicon AFM probes are available without coating (no reflective, no conductive coating). Extremely sharp tips allow the user to obtain high-quality images of samples. Standard chip sizes make our AFM probes compatible with most AFM manufacturers.

$320.00

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Specifications

Cantilever
Length
Width
Thickness
Resonant Frequency kHz
Force Constant Nm
± 10μm
± 5μm
± 0.5μm
Min
Typical
Max
Min
Typical
Max
NSG1095 30 2 140 240 390 3.1 11.8 37.6

Cantilever Specifications
Material Single Crystal Silicon, N-type, 0.01-0.025 Ω-cm, Antimony doped
Cantilever Geometry Rectangular (cross-section is trapezium)
Number of Cantilevers 1
Back Side Coating None
Tip Side Coating None
Tip Specifications
Tip Geometry Tetrahedral, the last 500 nm from tip apex is cylindrical
Tip Height 14 – 16 μm
Tip Aspect Ratio 3:1 – 7:1
Tip Offset (Setback) 5 – 20 μm
Tip Front Angle 10 ± 2°
Tip Back Angle 30 ± 2°
Tip Side Angle (half) 18 ± 2°
Tip Cone Angle 7 – 10°
Tip Curvature Radius (Nom) 6 nm (uncoated)
Tip Curvature Radius (Max) 10 nm (guaranteed)
General Information
  • Standard chip size: 1.6×3.4×0.3 mm
  • The base silicon is highly doped to avoid electrostatic charges.

Additional Information

Product Yield
Guaranteed product yield is better than 90%
Packaging
Probes are packaged in GelPak® boxes (GelPak® is a registered trade mark of Vichem Corporation)
Warranty
  • 1 year for uncoated probes
  • 6 months for probes with conductive coating
Shipping
All in-stock items ship within 24 hours.
Standard Ground, 2-Day, Next Day options available.
Details Price QTY
NSG10/Bare/15
Cantilever Series: NSG10
Product Tip Quantity: 15
$320.00