Calibration Gratings

AFM Calibration
K-Tek Nanotechnology supplies full line of calibration standards for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep and cross-coupling effects, and determination of the tip shape.
AFM Submicron Calibration
Grating for SPM and STM submicron calibration in X or Y direction
Scalloped Aluminum Grating
Scalloped Aluminum Grating for AFM reference and calibration standard in XY plane
SiC Calibration
6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in several nanometers interval. The simplicity of calibration process is provided by nearly uniform distribution of either half-monolayer high (0.75 nm) or monolayer high (1.5 nm) stepson the sample surface demonstrating chemical and mechanical stability. The step height corresponds to half of the lattice constant of 6H-SiC crystal in 0001 direction.
Calibration Grating Sets
K-Tek Nanotechnology supplies complete sets of calibration standards for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep and cross-coupling effects, and determination of the tip shape.