Diffraction Grating
Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.
Grating description
Structure:
- glas...
Test Grating
Test grating TGG1 is intended for:
- SPM calibration in X or Y axis;
- detection of lateral and vertical scanner nonlinearity;
- detection of angular distortion;
- tip characterizat...
Test Grating
Test grating TGQ1 is intended for:
- simultaneous calibration in X, Y and Z directions;
- lateral calibration of SPM scanners;
- detection of lateral non-linearity, hysteresis, creep and cross...
TF:1-800-880-0172
